高加速老化试验箱

Name:高加速老化试验箱
Model:PC-422R8
Applied stanard:JESD22-A110D
Applicable object:半导体封装产品
Test standard:ΔT=±0.5℃ Δ=±1% ΔV=±0.1V
T: 100℃-150℃ 55-100%
Bias Vmax=600V
Model:PC-422R8
Applied stanard:JESD22-A110D
Applicable object:半导体封装产品
Test standard:ΔT=±0.5℃ Δ=±1% ΔV=±0.1V
T: 100℃-150℃ 55-100%
Bias Vmax=600V